/*
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*
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* FocalTech TouchScreen driver.
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*
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* Copyright (c) 2012-2018, FocalTech Systems, Ltd., all rights reserved.
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*
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* This software is licensed under the terms of the GNU General Public
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* License version 2, as published by the Free Software Foundation, and
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* may be copied, distributed, and modified under those terms.
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*
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* This program is distributed in the hope that it will be useful,
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* but WITHOUT ANY WARRANTY; without even the implied warranty of
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* MERCHANTABILITY or FITNESS FOR A PARTICULAR PURPOSE. See the
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* GNU General Public License for more details.
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*
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*/
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#ifndef _TEST_LIB_H
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#define _TEST_LIB_H
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/*****************************************************************************
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* Included header files
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*****************************************************************************/
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#include <linux/kernel.h>
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#include <linux/module.h>
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#include <linux/slab.h>
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#include <linux/debugfs.h>
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#include <linux/uaccess.h>
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#include <linux/i2c.h>//iic
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#include <linux/delay.h>//msleep
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#include <linux/string.h>
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#include <asm/unistd.h>
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#include <linux/vmalloc.h>
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#include "../focaltech_core.h"
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#include "focaltech_test_ini.h"
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/*****************************************************************************
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* Macro definitions using #define
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*****************************************************************************/
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#define FTS_INI_FILE_PATH "/mnt/sdcard/"
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#define FTS_CSV_FILE_NAME "testdata.csv"
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#define FTS_TXT_FILE_NAME "testresult.txt"
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#define false 0
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#define true 1
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#define TEST_ICSERIES_LEN (8)
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#define TEST_ICSERIES(x) ((x) >> TEST_ICSERIES_LEN)
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#define TEST_OPEN_MAX_VALUE (255)
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#define BYTES_PER_TIME (32) /* max:128 */
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/* CSV & TXT */
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#define CSV_LINE1_BUFFER_LEN (1024*1)
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#define CSV_LINE2_BUFFER_LEN (1024*2)
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#define CSV_DATA_BUFFER_LEN (1024*80)
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#define CSV_BUFFER_LEN (CSV_LINE1_BUFFER_LEN + CSV_LINE2_BUFFER_LEN + CSV_DATA_BUFFER_LEN)
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#define TXT_BUFFER_LEN (1024*80*5)
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/*-----------------------------------------------------------
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Test Status
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-----------------------------------------------------------*/
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#define RESULT_NULL 0
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#define RESULT_PASS 1
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#define RESULT_NG 2
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#define TX_NUM_MAX 60
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#define RX_NUM_MAX 60
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#define NUM_MAX ((TX_NUM_MAX)*(RX_NUM_MAX))
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#define NUM_MAX_SC (144)
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#define KEY_NUM_MAX 6
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#define TEST_ITEM_COUNT_MAX 32
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#define TEST_SHORT_RES_MAX 0xFFFF
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/*
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* factory test registers
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*/
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#define ENTER_WORK_FACTORY_RETRIES 5
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#define START_SCAN_RETRIES_INCELL 20
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#define START_SCAN_RETRIES_DELAY_INCELL 16
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#define FACTORY_TEST_RETRY 50
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#define FACTORY_TEST_DELAY 18
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#define FACTORY_TEST_RETRY_DELAY 100
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#define DEVIDE_MODE_ADDR 0x00
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#define REG_FW_CHIP_IDL 0x9F
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#define REG_FW_IC_TYPE 0xA0
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#define REG_FW_IC_VERSION 0xB1
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#define REG_FW_CHIP_IDH 0xA3
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#define REG_FW_VERSION 0xA6
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#define REG_VA_TOUCH_THR 0x80
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#define REG_VKEY_TOUCH_THR 0x82
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#define FACTORY_REG_LINE_ADDR 0x01
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#define FACTORY_REG_CHX_NUM 0x02
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#define FACTORY_REG_CHY_NUM 0x03
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#define FACTORY_REG_CLB 0x04
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#define FACTORY_REG_DATA_SELECT 0x06
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#define FACTORY_REG_RAWBUF_SELECT 0x09
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#define FACTORY_REG_KEY_CBWIDTH 0x0B
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#define FACTORY_REG_PARAM_UPDATE_STATE 0x0E
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#define FACTORY_REG_SHORT_TEST_EN 0x0F
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#define FACTORY_REG_SHORT_TEST_STATE 0x10
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#define FACTORY_REG_LCD_NOISE_START 0x11
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#define FACTORY_REG_LCD_NOISE_FRAME 0x12
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#define FACTORY_REG_LCD_NOISE_NUMBER 0x13
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#define FACTORY_REG_LCD_NOISE_TTHR 0x14
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#define FACTORY_REG_OPEN_START 0x15
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#define FACTORY_REG_OPEN_STATE 0x16
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#define FACTORY_REG_CB_ADDR_H 0x18
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#define FACTORY_REG_CB_ADDR_L 0x19
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#define FACTORY_REG_LCD_NOISE_STATE 0x1E
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#define FACTORY_REG_KEYSHORT_EN 0x2E
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#define FACTORY_REG_KEYSHORT_STATE 0x2F
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#define FACTORY_REG_LEFT_KEY 0x1E
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#define FACTORY_REG_RIGHT_KEY 0x1F
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#define FACTORY_REG_OPEN_REG20 0x20
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#define FACTORY_REG_OPEN_REG21 0x21
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#define FACTORY_REG_OPEN_REG22 0x22
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#define FACTORY_REG_OPEN_REG23 0x23
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#define FACTORY_REG_OPEN_REG86 0x86
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#define FACTORY_REG_K1 0x31
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#define FACTORY_REG_K2 0x32
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#define FACTORY_REG_RAWDATA_ADDR 0x6A
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#define FACTORY_REG_CB_ADDR 0x6E
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#define FACTORY_REG_SHORT_ADDR 0x89
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#define FACTORY_REG_RAWDATA_TEST_EN 0x9E
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#define FACTORY_REG_CB_TEST_EN 0x9F
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#define FACTORY_REG_OPEN_TEST_EN 0xA0
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/* mc_sc */
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#define FACTORY_REG_FRE_LIST 0x0A
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#define FACTORY_REG_NORMALIZE 0x16
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#define FACTORY_REG_RAWDATA_ADDR_MC_SC 0x36
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#define FACTORY_REG_PATTERN 0x53
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#define FACTORY_REG_NOMAPPING 0x54
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#define FACTORY_REG_CHX_NUM_NOMAP 0x55
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#define FACTORY_REG_CHY_NUM_NOMAP 0x56
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#define FACTORY_REG_WC_SEL 0x09
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#define FACTORY_REG_MC_SC_MODE 0x44
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#define FACTORY_REG_MC_SC_CB_ADDR_OFF 0x45
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#define FACTORY_REG_MC_SC_CB_ADDR 0x4E
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#define FACTROY_REG_SHORT_TEST_EN 0x07
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#define FACTROY_REG_SHORT_CA 0x01
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#define FACTROY_REG_SHORT_CC 0x02
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#define FACTROY_REG_SHORT_CG 0x03
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#define FACTROY_REG_SHORT_OFFSET 0x04
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#define FACTROY_REG_SHORT_AB_CH 0x58
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#define FACTROY_REG_SHORT_DELAY 0x5A
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#define FACTORY_REG_SHORT_ADDR_MC 0xF4
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#define FACTORY_REG_FIR 0xFB
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/* sc */
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#define FACTORY_REG_SCAN_ADDR2 0x08
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#define FACTORY_REG_CH_NUM_SC 0x0A
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#define FACTORY_REG_KEY_NUM_SC 0x0B
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#define FACTORY_REG_SC_CB_ADDR_OFF 0x33
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#define FACTORY_REG_SC_CB_ADDR 0x39
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#define FACTORY_REG_RAWDATA_SADDR_SC 0x34
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#define FACTORY_REG_RAWDATA_ADDR_SC 0x35
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#define FACTORY_REG_CB_SEL 0x41
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#define FACTORY_REG_FMODE 0xAE
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#define TEST_RETVAL_00 0x00
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#define TEST_RETVAL_AA 0xAA
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/*****************************************************************************
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* enumerations, structures and unions
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*****************************************************************************/
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struct csv_format {
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u8 *buffer;
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int length;
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u8 *line2_buffer;
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int line2_len;
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int start_line;
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int item_count;
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u8 *data_buffer;
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int data_len;
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};
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/* incell */
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struct incell_testitem {
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u32 short_test : 1;
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u32 open_test : 1;
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u32 cb_test : 1;
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u32 rawdata_test : 1;
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u32 lcdnoise_test : 1;
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u32 keyshort_test : 1;
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};
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struct incell_threshold_b {
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int short_res_min;
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int short_res_vk_min;
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int open_cb_min;
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int open_k1_check;
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int open_k1_value;
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int open_k2_check;
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int open_k2_value;
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int cb_min;
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int cb_max;
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int cb_vkey_check;
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int cb_min_vk;
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int cb_max_vk;
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int rawdata_min;
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int rawdata_max;
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int rawdata_vkey_check;
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int rawdata_min_vk;
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int rawdata_max_vk;
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int lcdnoise_frame;
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int lcdnoise_coefficient;
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int lcdnoise_coefficient_vkey;
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int open_nmos;
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int keyshort_k1;
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int keyshort_cb_max;
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int rawdata2_min;
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int rawdata2_max;
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};
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struct incell_threshold {
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struct incell_threshold_b basic;
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int *rawdata_min;
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int *rawdata_max;
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int *rawdata2_min;
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int *rawdata2_max;
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int *cb_min;
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int *cb_max;
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};
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struct incell_test {
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struct incell_threshold thr;
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union {
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int tmp;
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struct incell_testitem item;
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} u;
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};
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/* mc_sc */
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enum mapping_type {
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MAPPING = 0,
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NO_MAPPING = 1,
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};
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struct mc_sc_testitem {
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u32 rawdata_test : 1;
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u32 rawdata_uniformity_test : 1;
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u32 scap_cb_test : 1;
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u32 scap_rawdata_test : 1;
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u32 short_test : 1;
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u32 panel_differ_test : 1;
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};
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struct mc_sc_threshold_b {
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int rawdata_h_min;
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int rawdata_h_max;
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int rawdata_set_hfreq;
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int rawdata_l_min;
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int rawdata_l_max;
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int rawdata_set_lfreq;
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int uniformity_check_tx;
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int uniformity_check_rx;
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int uniformity_check_min_max;
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int uniformity_tx_hole;
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int uniformity_rx_hole;
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int uniformity_min_max_hole;
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int scap_cb_off_min;
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int scap_cb_off_max;
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int scap_cb_wp_off_check;
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int scap_cb_on_min;
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int scap_cb_on_max;
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int scap_cb_wp_on_check;
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int scap_rawdata_off_min;
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int scap_rawdata_off_max;
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int scap_rawdata_wp_off_check;
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int scap_rawdata_on_min;
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int scap_rawdata_on_max;
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int scap_rawdata_wp_on_check;
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int short_cg;
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int short_cc;
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int panel_differ_min;
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int panel_differ_max;
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};
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struct mc_sc_threshold {
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struct mc_sc_threshold_b basic;
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int *rawdata_h_min;
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int *rawdata_h_max;
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int *rawdata_l_min;
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int *rawdata_l_max;
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int *tx_linearity_max;
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int *tx_linearity_min;
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int *rx_linearity_max;
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int *rx_linearity_min;
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int *scap_cb_off_min;
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int *scap_cb_off_max;
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int *scap_cb_on_min;
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int *scap_cb_on_max;
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int *scap_rawdata_off_min;
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int *scap_rawdata_off_max;
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int *scap_rawdata_on_min;
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int *scap_rawdata_on_max;
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int *panel_differ_min;
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int *panel_differ_max;
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};
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struct mc_sc_test {
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struct mc_sc_threshold thr;
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union {
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u32 tmp;
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struct mc_sc_testitem item;
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} u;
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};
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/* sc */
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struct sc_testitem {
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u32 rawdata_test : 1;
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u32 cb_test : 1;
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u32 delta_cb_test : 1;
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};
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struct sc_threshold_b {
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int rawdata_min;
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int rawdata_max;
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int cb_min;
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int cb_max;
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int dcb_base;
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int dcb_differ_max;
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int dcb_key_check;
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int dcb_key_differ_max;
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int dcb_ds1;
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int dcb_ds2;
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int dcb_ds3;
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int dcb_ds4;
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int dcb_ds5;
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int dcb_ds6;
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int dcb_critical_check;
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int dcb_cs1;
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int dcb_cs2;
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int dcb_cs3;
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int dcb_cs4;
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int dcb_cs5;
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int dcb_cs6;
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};
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struct sc_threshold {
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struct sc_threshold_b basic;
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int *rawdata_min;
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int *rawdata_max;
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int *cb_min;
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int *cb_max;
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int *dcb_sort;
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int *dcb_base;
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};
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struct sc_test {
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struct sc_threshold thr;
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union {
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u32 tmp;
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struct sc_testitem item;
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} u;
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};
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enum test_hw_type {
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IC_HW_INCELL = 1,
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IC_HW_MC_SC,
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IC_HW_SC,
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};
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enum test_scan_mode {
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SCAN_NORMAL = 0,
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SCAN_SC,
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};
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struct fts_test_node {
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int channel_num;
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int tx_num;
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int rx_num;
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int node_num;
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int key_num;
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};
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struct fts_test {
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struct fts_ts_data *ts_data;
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struct fts_test_node node;
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struct fts_test_node sc_node;
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u32 ic_ver;
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u8 fw_ver;
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u8 va_touch_thr;
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u8 vk_touch_thr;
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bool key_support;
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bool v3_pattern;
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u8 mapping;
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u8 normalize;
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int test_num;
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int *buffer;
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int buffer_length;
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int *node_valid;
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int *node_valid_sc;
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int basic_thr_count;
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int code1;
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int code2;
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int offset;
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union {
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struct incell_test incell;
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struct mc_sc_test mc_sc;
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struct sc_test sc;
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} ic;
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struct test_funcs *func;
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struct csv_format csv;
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char *testresult;
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int testresult_len;
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struct ini_data ini;
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};
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struct test_funcs {
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u64 ctype[FTX_MAX_COMPATIBLE_TYPE];
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enum test_hw_type hwtype;
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int startscan_mode;
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int key_num_total;
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bool rawdata2_support;
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bool force_touch;
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int (*param_init)(void);
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int (*init)(void);
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int (*start_test)(void);
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};
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enum byte_mode {
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DATA_ONE_BYTE,
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DATA_TWO_BYTE,
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};
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/* mc_sc */
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enum normalize_type {
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NORMALIZE_OVERALL,
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NORMALIZE_AUTO,
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};
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enum wp_type {
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WATER_PROOF_OFF = 0,
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WATER_PROOF_ON = 1,
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WATER_PROOF_ON_TX,
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WATER_PROOF_ON_RX,
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WATER_PROOF_OFF_TX,
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WATER_PROOF_OFF_RX,
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};
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/* mc end */
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/* sc */
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enum factory_mode {
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FACTORY_NORMAL,
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FACTORY_TESTMODE_1,
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FACTORY_TESTMODE_2,
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};
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enum dcb_sort_num {
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DCB_SORT_MIN = 1,
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DCB_SORT_MAX = 6,
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};
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struct dcb_sort_d {
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int ch_num;
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int deviation;
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int critical;
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int min;
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int max;
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};
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/* sc end */
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enum csv_itemcode_incell {
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CODE_ENTER_FACTORY_MODE = 0,
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CODE_RAWDATA_TEST = 7,
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CODE_CB_TEST = 12,
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CODE_SHORT_TEST = 14,
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CODE_OPEN_TEST = 15,
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CODE_LCD_NOISE_TEST = 19,
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};
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enum csv_itemcode_mc_sc {
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CODE_M_RAWDATA_TEST = 7,
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CODE_M_SCAP_CB_TEST = 9,
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CODE_M_SCAP_RAWDATA_TEST = 10,
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CODE_M_WEAK_SHORT_CIRCUIT_TEST = 15,
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CODE_M_PANELDIFFER_TEST = 20,
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};
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enum csv_itemcode_sc {
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CODE_S_RAWDATA_TEST = 7,
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CODE_S_CB_TEST = 13,
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CODE_S_DCB_TEST = 14,
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};
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/*****************************************************************************
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* Global variable or extern global variabls/functions
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*****************************************************************************/
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extern struct test_funcs test_func_ft8201;
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extern struct fts_test *fts_ftest;
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void sys_delay(int ms);
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int focal_abs(int value);
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void print_buffer(int *buffer, int length, int line_num);
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int fts_test_read_reg(u8 addr, u8 *val);
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int fts_test_write_reg(u8 addr, u8 val);
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int fts_test_read(u8 addr, u8 *readbuf, int readlen);
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int fts_test_write(u8 addr, u8 *writebuf, int writelen);
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int enter_work_mode(void);
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int enter_factory_mode(void);
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int read_mass_data(u8 addr, int byte_num, int *buf);
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int chip_clb(void);
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int wait_state_update(u8 retval);
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int get_cb_incell(u16 saddr, int byte_num, int *cb_buf);
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int short_get_adcdata_incell(u8 retval, u8 ch_num, int byte_num, int *adc_buf);
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int start_scan(void);
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int get_rawdata(int *data);
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int get_cb_sc(int byte_num, int *cb_buf, enum byte_mode mode);
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bool compare_data(int *data, int min, int max, int min_vk, int max_vk, bool key);
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bool compare_array(int *data, int *min, int *max, bool key);
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void show_data(int *data, bool key);
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void save_data_csv(int *data, char *name, u8 code, bool mc_sc, bool key);
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/* mc_sc */
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int mapping_switch(u8 mapping);
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bool get_fw_wp(u8 wp_channel_select, enum wp_type water_proof_type);
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int get_cb_mc_sc(u8 wp, int byte_num, int *cb_buf, enum byte_mode mode);
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int get_rawdata_mc_sc(enum wp_type wp, int *data);
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int get_rawdata_mc(u8 fre, u8 fir, int *rawdata);
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void short_print_mc(int *r, int num);
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int short_get_adc_data_mc(u8 retval, int byte_num, int *adc_buf, u8 mode);
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bool compare_mc_sc(bool, bool, int *, int *, int *);
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void show_data_mc_sc(int *data);
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void *fts_malloc(size_t size);
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void fts_free_proc(void *p);
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int fts_test_init(struct i2c_client *client);
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int fts_test_exit(struct i2c_client *client);
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#define fts_malloc_r(p, size) do {\
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if (NULL == p) {\
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p = fts_malloc(size);\
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if (NULL == p) {\
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return -ENOMEM;\
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}\
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}\
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} while(0)
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#define fts_free(p) do {\
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if (p) {\
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fts_free_proc(p);\
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p = NULL;\
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}\
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} while(0)
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#define TEST_IC_VERSION(idh, idl, ver1, ver0) \
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(((idh) << 24) | ((idl) << 16) | ((ver1) << 8) | (ver0))
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#define CSV_SUPPORT 1
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#define FOCAL_TEST_DEBUG_EN 1
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#if (FOCAL_TEST_DEBUG_EN)
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#define FTS_TEST_DBG(fmt, args...) do {printk("[FTS][TEST]%s. line: %d. "fmt"\n", __FUNCTION__, __LINE__, ##args);} while (0)
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#define FTS_TEST_FUNC_ENTER() printk("[FTS][TEST]%s: Enter(%d)\n", __func__, __LINE__)
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#define FTS_TEST_FUNC_EXIT() printk("[FTS][TEST]%s: Exit(%d)\n", __func__, __LINE__)
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#else
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#define FTS_TEST_DBG(fmt, args...) do{}while(0)
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#define FTS_TEST_FUNC_ENTER()
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#define FTS_TEST_FUNC_EXIT()
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#endif
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#define FTS_TEST_INFO(fmt, args...) do { printk(KERN_ERR "[FTS][TEST][Info]%s. line: %d. "fmt"\n", __FUNCTION__, __LINE__, ##args);} while (0)
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#define FTS_TEST_ERROR(fmt, args...) do { printk(KERN_ERR "[FTS][TEST][Error]%s. line: %d. "fmt"\n", __FUNCTION__, __LINE__, ##args);} while (0)
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#define FTS_TEST_SAVE_INFO(fmt, args...) do { \
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if (fts_ftest->testresult) { \
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fts_ftest->testresult_len += snprintf( \
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fts_ftest->testresult + fts_ftest->testresult_len, \
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TXT_BUFFER_LEN, \
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fmt, ##args);\
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} \
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} while (0)
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#define FTS_TEST_SAVE_ERR(fmt, args...) do { \
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if (fts_ftest->testresult) { \
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fts_ftest->testresult_len += snprintf( \
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fts_ftest->testresult + fts_ftest->testresult_len, \
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TXT_BUFFER_LEN, \
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fmt, ##args);\
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} \
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printk(KERN_ERR "[FTS][TEST][Error]%s. line: %d. "fmt"", __FUNCTION__, __LINE__, ##args);\
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} while (0)
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#endif
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